DocumentCode :
3591144
Title :
Railway traction reliability
Author :
Mermet-Guyennet, Michel ; Piton, Michel
Author_Institution :
PRIMES Lab., Alstom Transp., Séméac, France
fYear :
2010
Firstpage :
1
Lastpage :
6
Abstract :
This paper discusses the commonly accepted method for life-time prediction for power converters in traction. The method is based on junction temperature estimation and thermal cycles on a given duty cycle. The predicted numbers of thermal cycles are compared to the curves giving the number of cycles to failure versus temperature cycles. These curves are extrapolated from power cycling tests. Power cycling tests and extrapolation method will be discussed, particularly under the aspect of failure mechanisms that are induced. There is a trend to increase the operational junction temperature of semiconductor device, this trend impose to find some new assembly technologies supporting higher thermal constraints. The impact for the design of power converter is also discussed.
Keywords :
extrapolation; power convertors; power system reliability; railways; semiconductor devices; traction; extrapolation method; junction temperature estimation; power converter; power cycling test; railway traction reliability; semiconductor device; temperature cycle; thermal constraint; thermal cycle; Converters; Failure analysis; Insulated gate bipolar transistors; Junctions; Temperature; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Power Electronics Systems (CIPS), 2010 6th International Conference on
Print_ISBN :
978-1-61284-814-3
Type :
conf
Filename :
5730634
Link To Document :
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