An Extraction of Two-Port Noise Parameters From Measured Noise Powers Using an Extended Six-Port Network

In this paper, we present a formulation for extracting the noise wave correlation matrix of a linear two-port device-under-test (DUT) from measured noise powers using a designed six-port network. The noise powers are measured using a conventional noise figure analyzer. The extracted noise wave correlation matrix can then be converted into conventional two-port noise parameters. The proposed measurement equipment is very simple and leads to a very low cost. The proposed method is experimentally verified through measurements of various DUT samples.