Maximizing electrical capabilities of test setup resources to enhance detection of setup problems (Test setup comprehensive- diagnostic)

This paper will explain occurrences and resolution of identified hardware issues encountered across all Test Sections - Wafer Sort and Final Test. The closed loop system was carefully utilized to stimulate test set-up resources thru the modification of test program, it achieves detection of defective/ abnormal functioning test hardware components, test cables, tester resources, and wrong values mounted on the test board (installed during repair) that results to low yield issues and test escapes. It´s a powerful tool in detection and rapid intervention of set-up failures before product testing. Relating to current ATE system diagnostics, the uniqueness of the tool is being implemented per device level. Detection: stimulating the tester resources in order to utilize the component under test and to measure the response with respect to the expected values and tolerance. Implementation: modifying software or hardware to add the specific tests to identify defective test setup components and setting up a limit that will be the reference for the measurement. A Graphical User Interface will pop up and prompt the status of the test setup and provide quick reference on possible root causes of the setup failures.