• DocumentCode
    3593767
  • Title

    Effects of thermal annealing on InAsP/GaInP strain-compensated multiple quantum wells

  • Author

    Mei, X.B. ; Tu, C.W. ; Jones, E.D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    1998
  • Firstpage
    552
  • Lastpage
    555
  • Abstract
    In this paper, we investigate the effects of annealing on 30-period strain-compensated InAs0.41P0.59/Ga0.13In0.87P MQWs annealed at different temperatures up to 630°C for 30 minutes. High resolution X-ray rocking curves show no difference between as-grown and annealed samples. The room-temperature photo-luminescence (PL) intensity increases with increasing annealing temperature up to 570°C and then decreases. PL at 4 K shows that a new peak appears on the lower-energy side of the exciton peak. The power- and temperature-dependence of the PL suggests that it be reasonable to attribute the new peak to some defect-related transitions. These defects do not affect the absorption properties, however, photocurrent measurements of the as-grown and the 600°C-annealed samples show that there is no observable difference between the electroabsorption properties of these samples
  • Keywords
    III-V semiconductors; X-ray diffraction; annealing; electroabsorption; excitons; gallium compounds; indium compounds; photoconductivity; photoluminescence; semiconductor quantum wells; 4 K; 530 to 630 degC; InAs0.41P0.59-Ga0.13In0.87 P; electroabsorption; exciton; high resolution X-ray rocking curves; photocurrent; photoluminescence intensity; power dependence; strain-compensated multiple quantum wells; strain-compensated wells; temperature-dependence; thermal annealing; Annealing; Capacitive sensors; Indium phosphide; Molecular beam epitaxial growth; Optical devices; Optical materials; Optical superlattices; Photoconductivity; Quantum well devices; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712602
  • Filename
    712602