DocumentCode :
3594068
Title :
The new generation package free LED: The performance and reliability of white chip
Author :
Wong, C.K.Y. ; Fan, G.Q. ; Leung, S.Y.Y. ; Yuan, C.C.A. ; Zhang, G.Q.
Author_Institution :
State Key Lab. of Solid State Lighting (Changzhou Base), Changzhou, China
fYear :
2014
Firstpage :
114
Lastpage :
119
Abstract :
Package free LED, whose characteristics as no leadframe/ reflector, is one of those emerging technology [1]. The package free LED has arose excessive attention in recent years because of its benefits in excellent color consistence, wide light distribution, low material cost and simple process. This study assesses the performance of “sheet forming type” package free LED under operational and humidity conditions. The lumen maintenance study shows insignificant degradation of opto-electrical performance of the devices. Color shift is also minimal. In the accelerated humidity condition, the device failed mostly due to die failure. Minimal optical degradation was found in the phosphor layer. Moisture induced failure which affects the interfacial integrity should be addressed so as to improve the reliability of the package free LED.
Keywords :
electronics packaging; humidity; light emitting diodes; reliability; accelerated humidity condition; color consistence; color shift; die failure; moisture induced failure; new generation package free LED; optical degradation; opto-electrical performance; sheet forming; white chip performance; white chip reliability; wide light distribution; Aging; Humidity; Image color analysis; Light emitting diodes; Phosphors; Reflectivity; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
Print_ISBN :
978-1-4799-6696-7
Type :
conf
DOI :
10.1109/SSLCHINA.2014.7127235
Filename :
7127235
Link To Document :
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