• DocumentCode
    3594074
  • Title

    Degradation of high-power LEDs — Luminous flux and TM 21 life time

  • Author

    Ganev, Hristo ; Tran Quoc Khanh

  • Author_Institution
    Lab. of Lighting Technol., Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2014
  • Firstpage
    141
  • Lastpage
    143
  • Abstract
    The reliability and the life time prediction are still one of the most important issues when we think about LEDs. The examination of these topics represents one of the goals of a joint project between research institutions and German lighting industry companies. We try to give answers to these questions using the state of the art approaches of accelerated life time tests and try to verify how the life time prediction methodology used at the moment fits with reality.
  • Keywords
    LED lamps; life testing; lighting; reliability; German lighting industry companies; TM 21 life time; accelerated life time tests; high-power LED degradation; life time prediction; life time prediction methodology; luminous flux; reliability; Aging; Current measurement; Degradation; Image color analysis; Light emitting diodes; Lighting; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
  • Print_ISBN
    978-1-4799-6696-7
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2014.7127241
  • Filename
    7127241