DocumentCode
3594074
Title
Degradation of high-power LEDs — Luminous flux and TM 21 life time
Author
Ganev, Hristo ; Tran Quoc Khanh
Author_Institution
Lab. of Lighting Technol., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear
2014
Firstpage
141
Lastpage
143
Abstract
The reliability and the life time prediction are still one of the most important issues when we think about LEDs. The examination of these topics represents one of the goals of a joint project between research institutions and German lighting industry companies. We try to give answers to these questions using the state of the art approaches of accelerated life time tests and try to verify how the life time prediction methodology used at the moment fits with reality.
Keywords
LED lamps; life testing; lighting; reliability; German lighting industry companies; TM 21 life time; accelerated life time tests; high-power LED degradation; life time prediction; life time prediction methodology; luminous flux; reliability; Aging; Current measurement; Degradation; Image color analysis; Light emitting diodes; Lighting; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
Print_ISBN
978-1-4799-6696-7
Type
conf
DOI
10.1109/SSLCHINA.2014.7127241
Filename
7127241
Link To Document