DocumentCode
3595907
Title
Reliability-aware operation chaining in high level synthesis
Author
Liang Chen ; Ebrahimi, Mojtaba ; Tahoori, Mehdi B.
Author_Institution
Karlsruhe Inst. of Technol., Karlsruhe, Germany
fYear
2015
Firstpage
1
Lastpage
6
Abstract
System reliability becomes one of the major design concerns in nanoscale VLSI technologies. To cope with the increasing design complexity and the challenge of cost-efficient reliability improvement, modular and hierarchical optimizations are essential in the design space exploration. In this paper a novel scheduling and binding approach is proposed to investigate the potentials of reliability enhancement in high level synthesis. Inspired by the observation that the timing resource within individual clock cycle can be redistributed to maximize reliability, we propose a reliability-aware operation chaining technique, considering both the behavioral operation vulnerabilities and RTL reliability-cost tradeoffs in functional units. Using a characterized RTL component library regarding soft error, the experimental results show that compared to the traditional chaining, with the same timing constraint the proposed technique can generate the RTL with 3X reduction of the system failure rate, while introducing only 15% area and 16% power overhead.
Keywords
VLSI; high level synthesis; integrated circuit design; integrated circuit reliability; radiation hardening (electronics); scheduling; RTL reliability-cost tradeoffs; behavioral operation vulnerabilities; characterized RTL component library; cost-efficient reliability improvement; design complexity; design space exploration; hierarchical optimizations; high level synthesis; individual clock cycle; modular optimizations; nanoscale VLSI technologies; reliability enhancement; reliability-aware operation chaining technique; soft error; system reliability; timing constraint; timing resource; Clocks; Delays; Libraries; Reliability engineering; Schedules;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2015 20th IEEE European
Type
conf
DOI
10.1109/ETS.2015.7138739
Filename
7138739
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