• DocumentCode
    3596560
  • Title

    Plasmonic enhancement of photocurrent in GaN based UV photodetectors

  • Author

    Shetty, Arjun ; Sundar, Kamal John ; Roul, Basanta ; Mukundan, Shruti ; Chandan, Greeshma ; Mohan, Lokesh ; Ghosh, Ambarish ; Vinoy, K.J. ; Krupanidhi, S.B.

  • Author_Institution
    Indian Inst. of Sci., Electr. Commun. Eng., India
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    200 nm thick films of gallium nitride were grown on sapphire substrate using molecular beam epitaxy. Gold nanoparticles were fabricated on the grown films by thermal evaporation followed by annealing. Aluminium nanostructures were fabricated on another set of films using nanosphere lithography. Interdigited electrodes were fabricated using standard lithography to form metal-semiconductor-metal photodetectors. The performance of bare gallium nitride films were compared with the samples that had Au nanoparticles and Al nanostructures. An enhancement of the photocurrent with negligible change in dark current was observed in both cases.
  • Keywords
    III-V semiconductors; annealing; electrochemical electrodes; gallium compounds; molecular beam epitaxial growth; nanofabrication; nanolithography; nanoparticles; nanosensors; nanostructured materials; photoconductivity; photodetectors; photoemission; plasmonics; thick film sensors; ultraviolet detectors; vacuum deposition; wide band gap semiconductors; GaN; Interdigited electrode; UV photodetector; aluminium nanostructure; annealing; dark current; gold nanoparticle; metal-semiconductor-metal photodetector; molecular beam epitaxy; nanofabrication; nanosphere lithography; photocurrent; plasmonic enhancement; sapphire substrate; size 200 nm; thermal evaporation; thick film sensor; Films; Gallium nitride; Gold; Nanoparticles; Photodetectors; Plasmons; Gallium nitride; UV photodetector; molecular beam epitaxy; nanosphere lithography; plasmonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Electronics (ICEE), 2014 IEEE 2nd International Conference on
  • Print_ISBN
    978-1-4673-6527-7
  • Type

    conf

  • DOI
    10.1109/ICEmElec.2014.7151138
  • Filename
    7151138