Effect of traps on small signal equivalent circuit in AlGaN/GaN HEMTs

The presence of electrical traps in AlGaN/GaN HEMT devices can play a major role in determining the power performance of the device. In this work we have carried out measurements to understand the role of traps in these devices. The study has been carried out by comparing the Pulse I-V measurements and S parameter measurements, on the devices with knee walkout and without knee walkout. The changes in the small signal equivalent circuit of the devices have also been studied.