• DocumentCode
    3596997
  • Title

    Characterisation of industrial-scale remote PECVD SiN depositions

  • Author

    Winderbaum, Saul ; Leo, Anthony J. ; Shea, Stephen P. ; Koval, Timothy D. ; Kumar, Bikash

  • Author_Institution
    Shamash Australia Pty Ltd., Australia
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1128
  • Abstract
    Remote PECVD SiN deposition parameters have been optimised for a fired-through metallization process on multicrystalline silicon solar cells. The best pressure, gas ratio and deposition temperature resulted in cell efficiencies of up to 14.3% when used with a 30 Ohm/square emitter and above 15% for 40 Ohm/square diffusion. Fourier transform infrared spectroscopy revealed that, during firing, the films lost a significant proportion of their hydrogen content, providing good bulk and surface passivation. In all cases the refractive index was reduced by approximately 1% during firing. The parameter space that gives optimal conditions for the lighter emitter coincides with a region in which the refractive index can be varied, resulting in greater process flexibility.
  • Keywords
    Fourier transform spectra; infrared spectra; metallisation; passivation; plasma CVD; refractive index; semiconductor growth; semiconductor thin films; silicon compounds; solar cells; wide band gap semiconductors; Fourier transform infrared spectroscopy; SiN; cell efficiencies; deposition temperature; gas ratio; hydrogen content; metallization process; multicrystalline silicon solar cells; parameter space; refractive index; remote PECVD SiN depositions; surface passivation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1306113