DocumentCode
3597529
Title
Observable Degree Analysis of SINS Initial Alignment Based on Singular Value Decomposition
Author
Rui, LONG ; Yong-yuan, QIN ; Ji-chao, JIA
Author_Institution
Coll. of Autom., Northwestern Polytech. Univ., Xian
fYear
2008
Firstpage
444
Lastpage
448
Abstract
In this paper, observable degree of SINS based on singular value decomposition (SVD) is analyzed during initial alignment, and an improved method using the right singular vectors to calculate the observable degrees is proposed. Firstly, an error model is introduced for SINS on rocking base. Secondly, the model is demonstrated to satisfy the piece-wise constant system (PWCS) analysis law. Thus, the observability of system states can be simply analyzed by using the stripped observability matrix (SOM) as the substitute for the complex total observability matrix (TOM). Then the observable degrees of system states of SINS are analyzed based on the SVD of PWCS observability matrix, and the method to calculate the observable degrees is improved. Finally, computer simulation is carried out, and the results of simulation indicate that observable degree indexes are able to better predict Kalman filtering errors of system states. Therefore, the improved method discussed in this paper is effective.
Keywords
observability; singular value decomposition; Kalman filtering errors; SINS initial alignment; error model; observable degree analysis; observable degree indexes; piece-wise constant system analysis law; singular value decomposition; singular vectors; strapdown inertial navigation system; stripped observability matrix; system state observability; total observability matrix; Computational modeling; Computer errors; Computer simulation; Filtering; Kalman filters; Matrices; Observability; Predictive models; Silicon compounds; Singular value decomposition; SINS; Singular value decomposition; observable degree; piece-wise constant system; right singular vector;
fLanguage
English
Publisher
ieee
Conference_Titel
Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
Print_ISBN
978-1-4244-3530-2
Electronic_ISBN
978-1-4244-3531-9
Type
conf
DOI
10.1109/KAMW.2008.4810520
Filename
4810520
Link To Document