• DocumentCode
    3597686
  • Title

    Modeling of Gaussian beam diffraction from a thick single-slit perfectly conducting screen: finite-difference time-domain method vs. rigorous theory

  • Author

    Alvarez-Cabanillas, M.A. ; Rong-Chung Tyan ; Fainman, Y.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
  • Volume
    3
  • fYear
    1999
  • Firstpage
    1878
  • Abstract
    We model the diffraction of incident beams with Gaussian and constant spatial profiles on a thick single-slit perfectly conducting screen. Slit sizes larger and smaller than the wavelength are considered. We calculate the diffraction patterns using the finite-difference time-domain method and compare the results to those obtained by rigorous theory. The results are in good agreement in both cases.
  • Keywords
    electromagnetic wave diffraction; finite difference time-domain analysis; Gaussian beam diffraction; constant spatial profiles; finite-difference time-domain method; incident beams; rigorous theory; slit sizes; thick single-slit perfectly conducting screen; Conductivity; Discrete Fourier transforms; Electromagnetic diffraction; Electromagnetic propagation; Electromagnetic scattering; Finite difference methods; Integral equations; Maxwell equations; Optical reflection; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.788323
  • Filename
    788323
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3597686