DocumentCode
3598255
Title
Effects of field plate on surface- and substrate-related power slump in GaAs MESFETTS
Author
Tanaka, T. ; Ueda, H. ; Horio, K.
Author_Institution
Faculty of Systems Engineering, Shibaura Institute of Technology
Volume
1
fYear
2010
Firstpage
1
Lastpage
4
Abstract
Two-dimensional transient analysis of GaAs MESFETs with a field plate is performed in which surface states and substrate traps are considered. It is studied how the existence of field plate affects slow current transients (lag phenomena) and power slump (current slump) due to surface states and substrate traps. It is shown that both surface-state-related and substrate-trap-related transients and power slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness to reduce the power slump and also to maintain high frequency performance of GaAs MESFETs.
Keywords
Charge carrier processes; Current slump; Gallium arsenide; Logic gates; MESFETs; Substrates; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals Systems and Electronics (ISSSE), 2010 International Symposium on
Print_ISBN
978-1-4244-6352-7
Type
conf
DOI
10.1109/ISSSE.2010.5638203
Filename
5638203
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