DocumentCode :
3598255
Title :
Effects of field plate on surface- and substrate-related power slump in GaAs MESFETTS
Author :
Tanaka, T. ; Ueda, H. ; Horio, K.
Author_Institution :
Faculty of Systems Engineering, Shibaura Institute of Technology
Volume :
1
fYear :
2010
Firstpage :
1
Lastpage :
4
Abstract :
Two-dimensional transient analysis of GaAs MESFETs with a field plate is performed in which surface states and substrate traps are considered. It is studied how the existence of field plate affects slow current transients (lag phenomena) and power slump (current slump) due to surface states and substrate traps. It is shown that both surface-state-related and substrate-trap-related transients and power slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness to reduce the power slump and also to maintain high frequency performance of GaAs MESFETs.
Keywords :
Charge carrier processes; Current slump; Gallium arsenide; Logic gates; MESFETs; Substrates; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals Systems and Electronics (ISSSE), 2010 International Symposium on
Print_ISBN :
978-1-4244-6352-7
Type :
conf
DOI :
10.1109/ISSSE.2010.5638203
Filename :
5638203
Link To Document :
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