• DocumentCode
    3598255
  • Title

    Effects of field plate on surface- and substrate-related power slump in GaAs MESFETTS

  • Author

    Tanaka, T. ; Ueda, H. ; Horio, K.

  • Author_Institution
    Faculty of Systems Engineering, Shibaura Institute of Technology
  • Volume
    1
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Two-dimensional transient analysis of GaAs MESFETs with a field plate is performed in which surface states and substrate traps are considered. It is studied how the existence of field plate affects slow current transients (lag phenomena) and power slump (current slump) due to surface states and substrate traps. It is shown that both surface-state-related and substrate-trap-related transients and power slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness to reduce the power slump and also to maintain high frequency performance of GaAs MESFETs.
  • Keywords
    Charge carrier processes; Current slump; Gallium arsenide; Logic gates; MESFETs; Substrates; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals Systems and Electronics (ISSSE), 2010 International Symposium on
  • Print_ISBN
    978-1-4244-6352-7
  • Type

    conf

  • DOI
    10.1109/ISSSE.2010.5638203
  • Filename
    5638203