Title :
Investigation of transient faults on JOP processor
Author :
Bahramnejad, Somayeh ; Zarandi, Hamid Reza ; Shojaei, Maryam
Author_Institution :
Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol., Tehran, Iran
Abstract :
This paper investigates the effect and propagation of transient faults on JOP (Java Optimized Processor). JOP processor is intended for applications of embedded real-time systems and the primary implementation technology is in an FPGA. The investigation is based on 4350 transient faults which are injected in the processor using simulation-based fault injection method. The effect and propagation of the faults on different parts of this processor are observed and evaluated. Based on the experimental results, bytecode cache and bytecode memory are two sensible parts in the processor, since about 100 percent of injected faults have affected them. The results show that between 81% and 85% of injected faults cause processor failure and between 12% and 14% of non-failing faults are overwritten.
Keywords :
Aerospace industry; Aerospace safety; Application software; Information technology; Java; Logic devices; Microprocessors; Real time systems; Registers; Single event upset;
Conference_Titel :
Automation Quality and Testing Robotics (AQTR), 2010 IEEE International Conference on
Print_ISBN :
978-1-4244-6724-2
DOI :
10.1109/AQTR.2010.5520800