DocumentCode :
3598783
Title :
Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology
Author :
Suzuki, Hajime ; Kurimoto, M. ; Yamanaka, T. ; Takata, Hiroto ; Makino, Hiroaki ; Shinohara, Hirofumi
Author_Institution :
Renesas Technol. Corp., Itami, Japan
fYear :
2008
Firstpage :
15
Lastpage :
20
Abstract :
The Post-Silicon Programmed Body-Biasing Platform is proposed to suppress device variability in the 45-nm CMOS technology era. The proposed platform measures device speed during post-fabrication testing. Then the fast die is marked so that the body-bias circuit turns on and reduces leakage current of the die that is selected and marked in a user application. Because the slow die around the speed specifications of a product is not body-biased, the product runs as fast as a normal non-body-biasing product. Although the leakage power of a fast die is reduced, the speed specification does not change. The proposed platform improves the worst corner specification comprising the two worst cases of speed and leakage power. The test chip, fabricated using 45-nm technology, improves the worst corner of stand-by leakage power vs. speed by 70%.
Keywords :
CMOS integrated circuits; integrated circuit testing; leakage currents; silicon; CMOS technology; body-bias circuit; device variability; fast die; leakage current; normal non-body-biasing product; post-fabrication testing; post-silicon programmed body-biasing platform; size 45 nm; speed specification; stand-by leakage power; test chip; CMOS technology; Circuit testing; Fuses; Leakage current; MOS devices; Master-slave; Programmable control; Read only memory; Switches; Variable structure systems; body-biasing; device variability suppression; leakage current reduction; post-silicon programming;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Print_ISBN :
978-1-4244-8634-2
Electronic_ISBN :
978-1-60558-109-5
Type :
conf
DOI :
10.1145/1393921.1393931
Filename :
5529076
Link To Document :
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