• DocumentCode
    3601632
  • Title

    Fast Electron Ionization Effect in Multigap Pseudospark Discharge Under Nanosecond Pulsed Voltages

  • Author

    Jia Zhang ; Junping Zhao ; Qiaogen Zhang

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
  • Volume
    43
  • Issue
    11
  • fYear
    2015
  • Firstpage
    3921
  • Lastpage
    3924
  • Abstract
    In this paper, research studies on the breakdown progresses of multigap pseudospark discharge under nanosecond pulsed voltages are reported. The experimental results show great differences from dc voltages. The discharge mechanism of the pseudospark under nanosecond pulsed voltages has been successfully explained by the fast electron ionization effect. In each gap, collision ionizations caused by the fast electron start step by step, and development progresses are almost the same and approximately simultaneous until the main gap breaks down.
  • Keywords
    plasma collision processes; sparks; breakdown progresses; dc voltages; fast electron ionization effect; multigap pseudospark discharge; nanosecond pulsed voltages; plasma collision ionizations; Anodes; Breakdown voltage; Cathodes; Discharges (electric); Fault diagnosis; Ionization; Plasmas; Fast electron ionization; multigap pseudospark; nanosecond pulsed voltages; nanosecond pulsed voltages.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2411693
  • Filename
    7063929