Title :
SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives
Author :
Zuolo, Lorenzo ; Zambelli, Cristian ; Micheloni, Rino ; Indaco, Marco ; Di Carlo, Stefano ; Prinetto, Paolo ; Bertozzi, Davide ; Olivo, Piero
Author_Institution :
Dipt. di Ing., Univ. degli Studi di Ferrara, Ferrara, Italy
Abstract :
Currently available electronic design automation tools for design space exploration of solid state drives (SSDs) are not able to assess: 1) the device architecture inefficiencies; 2) architecture overdesign for a target performance; and 3) performance degradation caused by the disk usage. These tools feature either an overly high abstraction modeling strategy or lack the required flexibility to perform design exploration. To overcome these problems, this paper proposes SSDExplorer, a tool for fine-grained yet reasonably fast design space exploration of different SSD architectures highlighting possible bottlenecks. To prove its accuracy SSDExplorer has been validated with two real SSDs. SSDExplorer efficiency has been assessed by evaluating the impact of the NAND flash read retry algorithm impact on the SSD performance as a function of its internal architecture.
Keywords :
NAND circuits; circuit CAD; flash memories; integrated circuit design; integrated circuit reliability; NAND flash read retry algorithm; SSD architectures; SSDExplorer; architecture overdesign; device architecture inefficiency; electronic design automation tools; high abstraction modeling strategy; performance degradation; performance-reliability-oriented fine-grained design space exploration; solid state drives; virtual platform; Accuracy; Computational modeling; Computer architecture; Data models; Flash memories; Performance evaluation; Timing; CAD; Computer-aided design (CAD); Design Space Exploration; NAND Flash; NAND flash; SSD; Simulation; Solid-State Drive; design space exploration; simulation; solid-state drive (SSD);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2422834