Title :
Lifetime Prediction of a Linear Transformer Driver Based on the Storage Capacitor Voltage Reversal Longevity
Author :
Jiangtao Li ; Wenzhong Chen ; Jianhao Li ; Yue Gu ; Tao Li ; Zheng Li
Author_Institution :
Sch. of Electr. Eng., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
In this paper, the mathematical lifetime models of capacitors and spark switches are investigated and a linear transformer driver circuit model consisting of five 100 kV/MA cavities is built. The effect of random failures, switch jitter and prefire probability, on the module lifetime is investigated, respectively, by observing the influence on the capacitor lifetime and module output. Sensitivity analysis of time delay jitter of switches and prefire probability of switches on the module lifetime is carried out. The module lifetime prediction model is built by the combination of the lifetime model of key components, random failure model, and the module circuit model. Examples are taken to illustrate the process of module lifetime prediction and maintenance cycle determination.
Keywords :
capacitor storage; driver circuits; jitter; power transformers; probability; sensitivity analysis; linear transformer driver lifetime prediction; module lifetime prediction model; prefire probability; random failure model; sensitivity analysis; spark switch; storage capacitor voltage reversal longevity; switch time delay jitter; Capacitors; Cavity resonators; Integrated circuit modeling; Jitter; Maintenance engineering; Power supplies; Predictive models; Fault-mode simulation; lifetime prediction; linear transformer driver (LTD); sensitivity analysis; sensitivity analysis.;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2424217