• DocumentCode
    3603324
  • Title

    Design Rules for Temperature Compensated Degenerately n-Type-Doped Silicon MEMS Resonators

  • Author

    Jaakkola, Antti ; Prunnila, Mika ; Pensala, Tuomas ; Dekker, James ; Pekko, Panu

  • Author_Institution
    VTT Tech. Res. Centre of Finland, Espoo, Finland
  • Volume
    24
  • Issue
    6
  • fYear
    2015
  • Firstpage
    1832
  • Lastpage
    1839
  • Abstract
    The first- and second-order temperature coefficients and the total temperature-induced frequency deviation of degenerately n-type-doped silicon resonators are modeled. Modeling is based on finite element modelling-based sensitivity analysis of various resonator geometries combined with the experimental results on doping-dependent elastic constants of n-type-doped silicon. The analysis covers a doping range from 2.4 × 1017 to 7.5 × 1019 cm-3. Families of resonance modes that can be temperature compensated via n-type doping are identified. These include bulk modes, such as the width/length extensional modes of a beam, Lamé/square extensional modes of a plate resonator, as well as flexural and torsional resonance modes. It is shown that virtually all resonance modes of practical importance can reach zero linear temperature coefficient of frequency when correctly designed. Optimal configurations are presented, where a total frequency deviation of ~150 ppm can be reached. The results suggest that full second-order temperature compensation familiar from AT cut quartz is not possible in silicon resonators with doping below 7.5 × 1019 cm-3. However, an analysis relying on extrapolated elastic constant data suggests the possibility of full second-order temperature compensation for a wide range of resonance modes when doping is extended beyond 1020 cm-3.
  • Keywords
    elemental semiconductors; finite element analysis; micromechanical resonators; sensitivity analysis; silicon; AT cut quartz; Lamé-square extensional modes; Si; beam width-length extensional modes; bulk modes; design rules; doping-dependent elastic constant data; finite element modelling-based sensitivity analysis; flexural resonance modes; plate resonator; resonator geometry; temperature compensated degenerately n-type-doped silicon MEMS resonators; torsional resonance modes; total temperature-induced frequency deviation; zero linear temperature coefficient; Data models; Doping; Resonant frequency; Semiconductor process modeling; Silicon; Temperature dependence; Temperature distribution; Micromechanical devices; acoustic waves; design for manufacture; design for manufacture.; radiofrequency microelectromechanical systems; temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2015.2443379
  • Filename
    7132690