DocumentCode
3603545
Title
Experimental Demonstration and Tolerancing of a Large-Scale Neural Network (165 000 Synapses) Using Phase-Change Memory as the Synaptic Weight Element
Author
Burr, Geoffrey W. ; Shelby, Robert M. ; Sidler, Severin ; di Nolfo, Carmelo ; Junwoo Jang ; Boybat, Irem ; Shenoy, Rohit S. ; Narayanan, Pritish ; Virwani, Kumar ; Giacometti, Emanuele U. ; Kurdi, Bulent N. ; Hyunsang Hwang
Author_Institution
IBM Res. - Almaden, San Jose, CA, USA
Volume
62
Issue
11
fYear
2015
Firstpage
3498
Lastpage
3507
Abstract
Using two phase-change memory devices per synapse, a three-layer perceptron network with 164 885 synapses is trained on a subset (5000 examples) of the MNIST database of handwritten digits using a backpropagation variant suitable for nonvolatile memory (NVM) + selector crossbar arrays, obtaining a training (generalization) accuracy of 82.2% (82.9%). Using a neural network simulator matched to the experimental demonstrator, extensive tolerancing is performed with respect to NVM variability, yield, and the stochasticity, linearity, and asymmetry of the NVM-conductance response. We show that a bidirectional NVM with a symmetric, linear conductance response of high dynamic range is capable of delivering the same high classification accuracies on this problem as a conventional, software-based implementation of this same network.
Keywords
backpropagation; multilayer perceptrons; phase change memories; MNIST database; NVM-conductance response; backpropagation; handwritten digit; large-scale neural network; neural network simulator; nonvolatile memory; phase-change memory device; selector crossbar array; synaptic weight element; three-layer perceptron network; Accuracy; Artificial neural networks; Neurons; Nonvolatile memory; Performance evaluation; Phase change materials; Training; Artificial neural networks; Machine learning; Multilayer perceptrons; Nonvolatile memory; Phase change memory;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2439635
Filename
7151827
Link To Document