• DocumentCode
    3604774
  • Title

    Threshold Shock Sensor Based on a Bistable Mechanism: Design, Modeling, and Measurements

  • Author

    Frangi, Attilio ; De Masi, Biagio ; Confalonieri, Federica ; Zerbini, Sarah

  • Author_Institution
    Dipt. di Ing. Civile e Ambientale, Politec. di Milano, Milan, Italy
  • Volume
    24
  • Issue
    6
  • fYear
    2015
  • Firstpage
    2019
  • Lastpage
    2026
  • Abstract
    We analyze and test a microelectromechanical systems (MEMS) shock sensor that switches from a first stable state to a second stable state when subjected to an acceleration exceeding a fixed value. The transition between the two states is obtained because of the bistability properties of specific elastic beams. These are fabricated with a curved initial shape and change their configuration due to the contact force transmitted by an inertial mass sensing the acceleration. No power supply is needed (the device is passive) and the state of the sensor can be detected whenever required in several ways, e.g., by inserting a weak link that is broken during the snap-through of the elastic beam and modifies the electrical resistance between two external contacts. In this paper, focusing on a specific realization with a 1000-g (where g is the acceleration of gravity) threshold, we discuss its modeling and validate it with the experimental data. Experiments are in very good agreement with the numerical simulations, and show that the detection method is stable and robust. Finally, we discuss possible sources of uncertainties and propose a novel optimized design.
  • Keywords
    electric resistance; microsensors; shock measurement; MEMS; bistable mechanism; electrical resistance; microelectromechanical systems; threshold shock sensor; Acceleration; Electric shock; Force; Mathematical model; Shape; Springs; Standards; Microelectromechanical systems (MEMS) sensors; bistable beam; shock sensor; shock sensor.;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2015.2462736
  • Filename
    7214210