• DocumentCode
    3607053
  • Title

    IGBT and Diode Behavior During Short-Circuit Type 3

  • Author

    Fuhrmann, Jan ; Klauke, Sebastian ; Eckel, Hans-Guenter

  • Author_Institution
    Inst. for Electr. Power Eng., Univ. of Rostock, Rostock, Germany
  • Volume
    62
  • Issue
    11
  • fYear
    2015
  • Firstpage
    3786
  • Lastpage
    3791
  • Abstract
    A short circuit during inverter operation can result in the so-called short-circuit types 2 and 3. The short-circuit type 3 results in an interaction with several current commutations between the Insulate-Gate Bipolar Transistor (IGBT) and the antiparallel diode. The switched ON IGBT, conducting no current before the short circuit occurs, has no plasma inside and can block any voltage. It behaves like a voltage-controlled current source, which can stress the diode by commutating the complete short-circuit current into the diode. An avalanche arises inside the diode, which can lead to a destruction of the diode. The current through the diode determines dv/dt and makes the diode a dominating semiconductor during the short circuit. The current source behavior of the IGBT can be verified with semiconductor simulations and measurements on a high-power 3.3-kV IGBT. In the simulations, the IGBT is replaced by a current source, which gives similar results. For the measurements, the gate-emitter voltage is varied to change the IGBT current without influencing the collector-emitter voltage.
  • Keywords
    active networks; avalanche diodes; insulated gate bipolar transistors; semiconductor diodes; short-circuit currents; IGBT; antiparallel diode; avalanche diode; collector-emitter voltage; diode behavior; gate-emitter voltage; insulated-gate bipolar transistor; inverter operation; short-circuit current; short-circuit type 3; voltage 3.3 kV; voltage-controlled current source; Current measurement; Insulated gate bipolar transistors; Integrated circuit modeling; Logic gates; P-i-n diodes; Voltage measurement; Insulate-gate bipolar transistor (IGBT); p-i-n diodes; power semiconductor devices; robustness; short-circuit type 3; short-circuit type 3.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2477324
  • Filename
    7277051