• DocumentCode
    3607162
  • Title

    Impact of Asymmetric Configurations on the Heterogate Germanium Electron–Hole Bilayer Tunnel FET Including Quantum Confinement

  • Author

    Padilla, J.L. ; Alper, C. ; Godoy, A. ; Gamiz, F. ; Ionescu, A.M.

  • Author_Institution
    Nanoelectronic Devices Lab., Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
  • Volume
    62
  • Issue
    11
  • fYear
    2015
  • Firstpage
    3560
  • Lastpage
    3566
  • Abstract
    We investigate the effect of asymmetric configurations on the heterogate germanium electron-hole bilayer tunnel FET (TFET) and assess the improvement that they provide in terms of boosting the typically very low ON-current levels of TFET devices in the presence of field-induced quantum confinement. We show that when a very strong inversion for holes is induced at the bottom of the channel, the formation of the inversion layer for electrons is shifted to higher gate voltages, which in turn enhances the electrostatic control of the band bending at the top of the channel. As a result, the pinning of the quantized energy subbands is prevented for a wider range of gate voltages, and this allows vertical band-to-band tunneling distances to be further reduced compared with the conventional symmetric electron-hole bilayer configurations.
  • Keywords
    elemental semiconductors; field effect transistors; germanium; inversion layers; tunnel transistors; asymmetric configuration; band-to-band tunneling; electrostatic control; field-induced quantum confinement; heterogate germanium electron-hole bilayer TFET; inversion layer; quantized energy subband; symmetric electron-hole bilayer configuration; tunnel field effect transistor; Charge carrier processes; Electrostatics; Germanium; Logic gates; Quantization (signal); Switches; Tunneling; Asymmetric layouts; band-to-band tunneling (BTBT); heterogate electron-hole bilayer tunnel FET (HG-EHBTFET); heterogate electron???hole bilayer tunnel FET (HG-EHBTFET); inversion layer; quantum confinement; quantum confinement.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2476350
  • Filename
    7279124