DocumentCode
3607162
Title
Impact of Asymmetric Configurations on the Heterogate Germanium Electron–Hole Bilayer Tunnel FET Including Quantum Confinement
Author
Padilla, J.L. ; Alper, C. ; Godoy, A. ; Gamiz, F. ; Ionescu, A.M.
Author_Institution
Nanoelectronic Devices Lab., Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
Volume
62
Issue
11
fYear
2015
Firstpage
3560
Lastpage
3566
Abstract
We investigate the effect of asymmetric configurations on the heterogate germanium electron-hole bilayer tunnel FET (TFET) and assess the improvement that they provide in terms of boosting the typically very low ON-current levels of TFET devices in the presence of field-induced quantum confinement. We show that when a very strong inversion for holes is induced at the bottom of the channel, the formation of the inversion layer for electrons is shifted to higher gate voltages, which in turn enhances the electrostatic control of the band bending at the top of the channel. As a result, the pinning of the quantized energy subbands is prevented for a wider range of gate voltages, and this allows vertical band-to-band tunneling distances to be further reduced compared with the conventional symmetric electron-hole bilayer configurations.
Keywords
elemental semiconductors; field effect transistors; germanium; inversion layers; tunnel transistors; asymmetric configuration; band-to-band tunneling; electrostatic control; field-induced quantum confinement; heterogate germanium electron-hole bilayer TFET; inversion layer; quantized energy subband; symmetric electron-hole bilayer configuration; tunnel field effect transistor; Charge carrier processes; Electrostatics; Germanium; Logic gates; Quantization (signal); Switches; Tunneling; Asymmetric layouts; band-to-band tunneling (BTBT); heterogate electron-hole bilayer tunnel FET (HG-EHBTFET); heterogate electron???hole bilayer tunnel FET (HG-EHBTFET); inversion layer; quantum confinement; quantum confinement.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2476350
Filename
7279124
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