• DocumentCode
    3607704
  • Title

    A Novel Three-State Contactless RF Micromachined Switch for Wireless Applications

  • Author

    Pal, J. ; Zhu, Y. ; Lu, J. ; Khan, F. ; Dao, D.

  • Author_Institution
    Queensland Micro & Nanotechnol. Centre, Griffith Univ., Griffith, NSW, Australia
  • Volume
    36
  • Issue
    12
  • fYear
    2015
  • Firstpage
    1363
  • Lastpage
    1365
  • Abstract
    This letter presents a novel three-state contactless radio frequency (RF) microelectromechanical systems switch for wireless applications. The switch is free from stiction and charge injection issues occurred inherently in contact-type RF MEMS switches, thereby increasing reliability and lifetime. The contactless switch is based on variable capacitance between signal lines and movable grounded electrodes controlled by electrostatic actuator. The movable grounded electrode has the capability to move bidirectionally, and therefore, the switch can change among ON-, OFF-, and deep OFF-states. Thus, additional isolation can be achieved in the deep OFF-state. The RF measurement results show that the contactless switch has a capacitance tuning ratio of 5.25 between OFF- and ON-states, and a higher tuning ratio of 11.18 between deep OFF- and ON-states. In addition, the switch exhibits -3.62 dB insertion loss and -24.43 dB isolation at 2.4 GHz. At 5 GHz, the insertion loss and isolation are -2.95 dB and -20.65 dB, respectively.
  • Keywords
    electrostatic actuators; microswitches; RF MEMS switches; electrostatic actuator; frequency 2.4 GHz; frequency 5 GHz; loss 2.95 dB; loss 3.62 dB; movable grounded electrodes; radio frequency microelectromechanical systems switch; signal lines; three-state contactless RF micromachined switch; variable capacitance; wireless applications; Capacitance; Insertion loss; Microswitches; Radio frequency; Tunable circuits and devices; RF MEMS switches; SOIMUMPs; contactless switch; three-state switch; threestate switch; tunable capacitor;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2487510
  • Filename
    7293086