DocumentCode :
3609973
Title :
Mixed Tunnel-FET/MOSFET Level Shifters: A New Proposal to Extend the Tunnel-FET Application Domain
Author :
Lanuzza, Marco ; Strangio, Sebastiano ; Crupi, Felice ; Palestri, Pierpaolo ; Esseni, David
Author_Institution :
Dept. of Comput. Eng., Modeling, Electron. & Syst. Eng., Univ. of Calabria, Rende, Italy
Volume :
62
Issue :
12
fYear :
2015
Firstpage :
3973
Lastpage :
3979
Abstract :
In this paper, we identify the level shifter (LS) for voltage up-conversion from the ultralow-voltage regime as a key application domain of tunnel FETs (TFETs). We propose a mixed TFET-MOSFET LS design methodology, which exploits the complementary characteristics of TFET and MOSFET devices. Simulation results show that the hybrid LS exhibits superior dynamic performance at the same static power consumption compared with the conventional MOSFET and pure TFET solutions. The advantage of the mixed design with respect to the conventional MOSFET approach is emphasized when lower voltage signals have to be up-converted, reaching an improvement of the energy-delay product up to three decades. When compared with the full MOSFET design, the mixed TFET-MOSFET solution appears to be less sensitive toward threshold voltage variations in terms of dynamic figures of merit, at the expense of higher leakage variability. Similar results are obtained for four different LS topologies, thus indicating that the hybrid TFET-MOSFET approach offers intrinsic advantages in the design of LS for voltage up-conversion from the ultralow-voltage regime compared with the conventional MOSFET and pure TFET solutions.
Keywords :
MOSFET; tunnel transistors; MOSFET level shifters; energy delay product; key application domain; leakage variability; mixed tunnel-FET; static power consumption; threshold voltage variations; tunnel-FET application domain; ultralow-voltage regime; voltage up-conversion; Capacitance; Circuit topology; Design automation; Integrated circuit modeling; MOSFET; Level shifter (LS); technology computer-aided design (TCAD); tunnel FET (TFET); tunnel FET (TFET).;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2494845
Filename :
7322194
Link To Document :
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