Title :
An Unconditionally Stable FDTD Model for Crosstalk Analysis of VLSI Interconnects
Author :
Kumar, Vobulapuram Ramesh ; Alam, Arsalan ; Kaushik, Brajesh Kumar ; Patnaik, Amalendu
Author_Institution :
Microelectron. & VLSI Group, IIT Roorkee, Roorkee, India
Abstract :
In this paper, an unconditionally stable finite-difference time-domain (US-FDTD) model is proposed for the crosstalk noise analysis of coupled very large scale integration interconnects. The accuracy of the proposed model is validated against the conventional FDTD model and HSPICE. It is observed that the proposed model is as accurate as the conventional FDTD and HSPICE. It is also observed that the stability of the proposed model is not constrained by the Courant-Friedrichs-Lewy stability condition. Depending on the time-step size, the proposed model can be up to 100× faster than the conventional FDTD.
Keywords :
VLSI; finite difference time-domain analysis; integrated circuit interconnections; HSPICE; VLSI interconnects; crosstalk noise analysis; finite-difference time-domain model; unconditionally stable FDTD model; very large scale integration interconnects; CMOS technology; Crosstalk; Finite difference methods; Semiconductor device modeling; Stability analysis; Time-domain analysis; Very large scale integration; CMOS; Courant-Friedrichs-Lewy (CFL) stability condition; Courant???Friedrichs???Lewy (CFL) stability condition; crosstalk; finite-difference time-domain (FDTD); unconditionally stable; very large scale integration (VLSI) interconnects; very large scale integration (VLSI) interconnects.;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2015.2494519
