Title :
Single Event Upset Sensitivity of D-Flip Flop of Infrared Image Sensors for Low Temperature Applications Down to 77 K
Author :
Artola, L. ; Hubert, G. ; Gilard, O. ; Ducret, S. ; Perrier, F. ; Boutillier, M. ; Garcia, P. ; Vignon, G. ; Baradat, B. ; Ricard, Nicolas
Author_Institution :
ONERA, French Aerosp. Lab., Toulouse, France
Abstract :
This paper presents for the first time the impact of cryogenic temperatures, down to 77 K, on the SEU sensitivity of D-Flip-Flop (DFF) of infrared image sensor. Estimations and a failure analysis at circuit level are presented and investigated considering the stored data configuration and the temperature. The comparisons with experimental data obtained under heavy ion at UCL are presented and consistent. A good correlation of SEU cross sections is revealed. A saturation effect is observed below 200 K.
Keywords :
cryogenic electronics; flip-flops; infrared imaging; ion beam effects; radiation hardening (electronics); D-flip flop; cryogenic temperatures; heavy ion; infrared image sensor; low temperature applications; single event upset sensitivity; Cryogenics; Flip-flops; Infrared image sensors; Integrated circuit modeling; Sensitivity; Single event transients; Single event upsets; Space vehicles; Temperature sensors; DFF; SET; heavy ions; infrared image sensors; low temperatures; modeling; single event transient;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2499316
