DocumentCode :
3611847
Title :
Microchannel Plate Detector Detection Efficiency to Monoenergetic Electrons Between 0.4 and 2.6 MeV
Author :
Blase, Ryan C. ; Benke, Roland R. ; Cooke, Chathan M. ; Pickens, Keith S.
Author_Institution :
Space Sci. & Eng. Div., Southwest Res. Inst., San Antonio, TX, USA
Volume :
62
Issue :
6
fYear :
2015
Firstpage :
3339
Lastpage :
3345
Abstract :
An unshielded microchannel plate detector was irradiated by an electron beam to determine the detection efficiency of electrons to create a detector signal or counts. Tested electron energies spanned a range of 400 kiloelectron volts to 2.6 million electron volts (MeV). Detection efficiency was found to decrease as the electron energy increased and ranged between 0.18 and 0.05 counts per incident electron, at 0.4 and 2.6 MeV, respectively. Simulations of beam losses over the experimental geometry were performed with MCNP6, and found to be similar in magnitude and possess a similar dependence over incident electron energy as the experimentally determined beam loss from beam current measurements. Detection efficiency as a function of incident angle of the electrons was also tested and relatively insignificant changes were observed. For the three beam energies and angles tested, deviation of the measured detection efficiency was 16%-22% (basically within the overlapping error bars of each measurement).
Keywords :
electron detection; microchannel plates; position sensitive particle detectors; MCNP6; beam angles; beam current measurements; beam losses; detector counts; detector signal; electron volt energy 0.4 MeV to 2.6 MeV; error bars; experimental geometry; incident electron energy; monoenergetic electrons; unshielded microchannel plate detector detection efficiency; Detectors; Electron beam applications; Noise measurement; Radiation effects; Space radiation; Detectors; electron beams; noise measurement; radiation transport modeling; space radiation effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2015.2488481
Filename :
7348740
Link To Document :
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