Title :
Single-Event Characterization of Bang-bang All-digital Phase-locked Loops (ADPLLs)
Author :
Chen, Y.P. ; Massengill, L.W. ; Bhuva, B.L. ; Holman, W.T. ; Loveless, T.D. ; Robinson, W.H. ; Gaspard, N.J. ; Witulski, A.F.
Author_Institution :
Vanderbilt Univ., Nashville, TN, USA
Abstract :
The single-event vulnerability of a bang-bang ADPLL is investigated through fault injection experiments and circuit simulations. Single-event upsets in the digital loop filter result in the worst-case error response of the ADPLL, often requiring phase reacquisition. Single-event tolerant design guidelines for the digital loop filter are proposed and validated through FPGA-based fault injection experiments.
Keywords :
circuit simulation; digital filters; digital phase locked loops; field programmable gate arrays; logic design; FPGA-based fault injection; bang-bang all-digital phase-locked loops; circuit simulations; digital loop filter; single-event characterization; single-event tolerant design guidelines; single-event upsets; Bang-bang control; Circuit simulation; Digital circuits; Digital filters; Phase locked loops; Single event upsets; ADPLL; digital circuits; digital filter; single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2496799
