Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

Circuit parameters and configuration are very important when studying the synergistic effects total dose/SET. We explore a method combining dynamic parameter measurement and spectrum analysis which lead to a better understanding of this complex phenomenon. In this paper symbolic circuit analysis is used to obtain the relationship between input, output and noise injection due to photocurrent generation in the form of a rational function using symbolic variables in the complex frequency domain. This simulation technique was able to predict the impact of (i) total dose level, (ii) circuit parameters, and (iii) the injected energy on the ASET shapes. Basic mechanisms as field collapse and collection efficiency were also predicted and assessed.