• DocumentCode
    3614760
  • Title

    Broadband electrical characterization of microwave substrates using T-resonator technique

  • Author

    B. Jokanovic;M. Rakic

  • Author_Institution
    Inst. IMTEL, Novi Beograd, Serbia
  • Volume
    1
  • fYear
    2003
  • fDate
    6/25/1905 12:00:00 AM
  • Firstpage
    348
  • Abstract
    This paper presents an improved method for broadband characterization of microwave substrates. The method is based on response measurement of an open microstrip T-resonator and calculations of an effective length of the resonator using given substrate characteristics and electromagnetic 3D analysis. Two Rogers´ dielectric substrates are measured: TMM 10 and RO 30101 in 1 to 27 GHz band.
  • Keywords
    "Microwave theory and techniques","Dielectric substrates","Dielectric measurements","Frequency measurement","Resonance","Electromagnetic measurements","Dielectric constant","Microwave integrated circuits","Length measurement","Microstrip resonators"
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications in Modern Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on
  • Print_ISBN
    0-7803-7963-2
  • Type

    conf

  • DOI
    10.1109/TELSKS.2003.1246242
  • Filename
    1246242