DocumentCode
3614760
Title
Broadband electrical characterization of microwave substrates using T-resonator technique
Author
B. Jokanovic;M. Rakic
Author_Institution
Inst. IMTEL, Novi Beograd, Serbia
Volume
1
fYear
2003
fDate
6/25/1905 12:00:00 AM
Firstpage
348
Abstract
This paper presents an improved method for broadband characterization of microwave substrates. The method is based on response measurement of an open microstrip T-resonator and calculations of an effective length of the resonator using given substrate characteristics and electromagnetic 3D analysis. Two Rogers´ dielectric substrates are measured: TMM 10 and RO 30101 in 1 to 27 GHz band.
Keywords
"Microwave theory and techniques","Dielectric substrates","Dielectric measurements","Frequency measurement","Resonance","Electromagnetic measurements","Dielectric constant","Microwave integrated circuits","Length measurement","Microstrip resonators"
Publisher
ieee
Conference_Titel
Telecommunications in Modern Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on
Print_ISBN
0-7803-7963-2
Type
conf
DOI
10.1109/TELSKS.2003.1246242
Filename
1246242
Link To Document