3618394

A-Si:H thin film transistors - reliability from materials to processes to devices

Yue Kuo

2004

6/26/1905 12:00:00 AM

197

197

"Thin film transistors","Materials reliability","Crystalline materials","Microelectronics","Dielectrics","Liquid crystal displays","Consumer electronics","Optoelectronic and photonic sensors","Optical device fabrication"

ieee

Integrated Reliability Workshop Final Report, 2004 IEEE International

0-7803-8517-9

conf

10.1109/IRWS.2004.1422780

1422780