Title :
Techniques for sensitizing RF path under SER test
Author :
J. Dabrowski;J.G. Bayon
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Sweden
fDate :
6/27/1905 12:00:00 AM
Abstract :
This work presents two techniques for sensitizing the RF loopback path for an integrated transceiver under SER test. The test aims at spot defects typical of the CMOS process. At the chip level the spot defects are represented by impairments in gain and/or noise figure. The sensitization is based on SNR control of the test stimulus or on using a tuned interferer. In both cases power level control is crucial. The discussion is supported by simulation experiments.
Keywords :
"Radio frequency","Transceivers","Noise figure","Noise measurement","Signal to noise ratio","Circuit faults","Degradation","Circuit testing","Baseband","CMOS process"
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465717
