DocumentCode :
3619524
Title :
Controlling the TCR of thin film resistors
Author :
P. Steinmann;S.M. Jacobsen;R. Higgins
Author_Institution :
Texas Instruments, Freising, Germany
fYear :
2000
fDate :
6/22/1905 12:00:00 AM
Firstpage :
452
Lastpage :
455
Keywords :
"Transistors","Resistors","Scattering","Conductive films","Electrons","Conductivity","Temperature distribution","Surface resistance","Charge carriers","Tunneling"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194812
Filename :
1503742
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619524