3619529

Fluctuation Limits on Scaling of CMOS SRAMs

A. Bhavnagarwala;A. Kapoor;J. Meindl

Georgia Institute of Technology, Atlanta, GA, USA

2000

6/22/1905 12:00:00 AM

472

475

"Fluctuations","Random access memory","Threshold voltage","Semiconductor device modeling","MOSFET circuits","Transistors","Stochastic processes","Doping","Semiconductor device noise","Geometry"

ieee

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

2-86332-248-6

conf

10.1109/ESSDERC.2000.194817

1503747