Title :
Influence of Layout Parameters on Triggering Behavior in 0.35um and 0.18um Process gg-nMOS ESD Protection Devices
Author :
M. Litzenberger;R. Pichler;D. Pogany;E. Gornik;K. Esmark;H. Gossner
Author_Institution :
Technical University Vienna, Austria
fDate :
6/23/1905 12:00:00 AM
Keywords :
"Electrostatic discharge","Protection"
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195269
