DocumentCode :
36203
Title :
Performance and Reliability Implications of Two-Dimensional Shading in Monolithic Thin-Film Photovoltaic Modules
Author :
Dongaonkar, Sourabh ; Deline, Chris ; Alam, Md. Ashraful
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
3
Issue :
4
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1367
Lastpage :
1375
Abstract :
We analyze the problem of partial shading in monolithically integrated thin-film photovoltaic (TFPV) modules, and explore how the shape and size of the shadows dictate their performance and reliability. We focus on the aspects of the shading problem unique to monolithic TFPV, arising from thin long rectangular series-connected cells, with partial shadows covering only a fraction of the cell area. Using calibrated 2-D circuit simulations, we show that due to the cell shape, the unshaded portion of partially shaded cell experiences higher heat dissipation due to redistribution of voltages and currents across the cells. We then use thermal imaging techniques to compare our results with module behavior under shade in realistic situations. We also analyze the effect of shadow size and orientation by considering several possible shading scenarios. We find that thin edge shadows can cause potentially catastrophic reverse bias damage, depending on their orientation. Finally, we show that external bypass diodes cannot protect the individual cells from shadow-induced reverse stress, but can limit the string output power loss for larger shadows.
Keywords :
solar cells; thin films; 2D shading; calibrated 2D circuit simulations; catastrophic reverse bias damage; cell shape; current redistribution; external bypass diodes; heat dissipation; module behavior; monolithically integrated thin-film photovoltaic modules; partial shadows; partially shaded cell; shadow orientation; shadow shape; shadow size; shadow-induced reverse stress; string output power loss; thermal imaging; thin edge shadows; thin long rectangular series-connected cells; voltage redistribution; Circuit simulation; Photovoltaic cells; Reliability; Thin film devices; Bypass diodes; circuit simulation; module simulation; partial shading; reverse-bias stress; thin-film photovoltaic (PV);
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2270349
Filename :
6558752
Link To Document :
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