Statistically enhanced optical coherence tomography

In this paper we derive a reconstruction method based on the maximum-likelihood approach. The measured system is represented here by a sequence of thin parallel layers parametrized by their respective thicknesses and indexes of refraction. Assuming ideal sharp response of the OCT setup, the parameters can be easily calculated from measured amplitude reflectivities and the corresponding delays. Our procedure can be demonstrated on a simple sample consisting of a thin layers sandwiched between two thicker layers of optically denser materials.