DocumentCode :
3620622
Title :
Substrate and phase noise characterization
Author :
S. Rochel;H. Onodera
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
448
Lastpage :
449
Keywords :
"Phase noise","Ring oscillators","Voltage-controlled oscillators","Circuit simulation","Circuit noise","1f noise","Design methodology","Noise measurement","Injection-locked oscillators","Optical coupling"
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
Type :
conf
DOI :
10.1109/CICC.2005.1568704
Filename :
1568704
Link To Document :
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