مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3624068

Title :

SiON Gate Dielectric Reliability

Author :

Paul Nicollian

Author_Institution :

fYear :

2006

Firstpage :

217

Lastpage :

217

Keywords :

"Dielectrics","Electromigration","Electronic design automation and methodology","Negative bias temperature instability","CMOS technology","Integrated circuit reliability","Integrated circuit interconnections"

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 2006 IEEE International

ISSN :

1930-8841

Print_ISBN :

1-4244-0296-4

Electronic_ISBN :

2374-8036

Type :

conf

DOI :

10.1109/IRWS.2006.305254

Filename :

4098731

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3624068