• DocumentCode
    3630985
  • Title

    Self-mixing displacement sensing using the junction voltage variation in a GaN laser

  • Author

    Russell Kliese;Yah Leng Lim;Karl Bertling;A. Ashrif A. Bakar;Thierry Bosch;Aleksandar D. Rakic

  • Author_Institution
    School of Information Technology and Electrical Engineering, The University of Queensland, QLD 4072, Australia
  • fYear
    2008
  • Firstpage
    23
  • Lastpage
    25
  • Abstract
    The self-mixing (SM) laser sensing technique allows a simple, self-aligned and robust system for measuring displacement. Low-cost blue emitting GaN laser diodes have recently become available due to the high volume requirements for Blu-ray Disc devices such as high-definition video players and gaming consoles. These GaN lasers have a significantly shorter wavelength (around 405 nm) compared to other semiconductor lasers (generally around 800 nm for SM sensors). Therefore, if used in SM displacement sensors, they provide significantly higher resolution. Further to that, the measurement resolution is affected by the ability of the system to properly interpret the movement corresponding to the fraction of the half wavelength of the laser resulting in an incomplete fringe. Doubling the number of fringes will reduce the global error when a fringe is not properly detected. In this paper we report the world´s first SM displacement measurement system based on junction voltage variation in blue emitting semiconductor lasers. Instead of monitoring the SM signals using a photo-diode, the signal is obtained via direct sensing of the laser junction voltage variation. This removes the need for a photo-diode, providing a cost reduction and increasing the reliability of the system. The sensitivity and precision of this system is evaluated and compared against the performance of systems using red (650 nm) and near IR (780 nm) laser based sensors with all three sensors sharing the same optical and electronic hardware.
  • Keywords
    "Voltage","Gallium nitride","Samarium","Semiconductor lasers","Optical sensors","Displacement measurement","Wavelength measurement","Sensor systems","Infrared sensors","Robustness"
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices, 2008. COMMAD 2008. Conference on
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4244-2716-1
  • Electronic_ISBN
    2377-5505
  • Type

    conf

  • DOI
    10.1109/COMMAD.2008.4802083
  • Filename
    4802083