Title :
Testing of digital system in real-time applications
Author :
M. Jevtic;M. Damnjanovic
Author_Institution :
Fac. of Electron. Eng., Nis Univ., Serbia
Abstract :
The topic of this paper is the testing real-time-systems for the reliable functioning and protection of the system environment for damages. Different applicated techniques for online testing on circuit, system and application level are considered. The modifications of some techniques made in order to accomplish the effective trade-off between space/time overhead and the cost of dependable real-time-system, are considered also.
Keywords :
"System testing","Digital systems","Real time systems","Circuit testing","Circuit faults","Costs","Electromagnetic transients","Logic testing","Circuits and systems","Process design"
Conference_Titel :
Microelectronics, 1995. Proceedings., 1995 20th International Conference on
Print_ISBN :
0-7803-2786-1
DOI :
10.1109/ICMEL.1995.500977
