Title :
An estimation method based on wavelet transformation for infrared image noise
Author :
Zhi-Yong Li; Zhen-Kang Shen; Wei-Ping Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Univ. of Defense Technol., Hunan, China
Abstract :
A method is presented for finding the accurate power spectral density of infrared detector noise. The 1/f/sup r/ random process is described by wavelet functions and a maximum likelihood method is employed to estimate the parameter r.
Keywords :
"Infrared imaging","Random processes","Signal to noise ratio","Infrared detectors","Parameter estimation","Discrete wavelet transforms","Maximum likelihood estimation","Equations","Filters","Signal processing"
Conference_Titel :
Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National
Print_ISBN :
0-7803-3306-3
DOI :
10.1109/NAECON.1996.517668
