• DocumentCode
    3633141
  • Title

    Layout for ESD and latchup robustness

  • Author

    Alan Righter

  • Author_Institution
    Analog Devices, USA
  • fYear
    2006
  • Firstpage
    371
  • Lastpage
    371
  • Keywords
    "Electrostatic discharge","Robustness","Guidelines","Earth Observing System","Integrated circuit layout","Manufacturing","Failure analysis","Routing","Instruments"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
  • Electronic_ISBN
    2164-9340
  • Type

    conf

  • Filename
    5256751
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633141