• DocumentCode
    3633716
  • Title

    Non-robust versus robust [test generation]

  • Author

    A. Pierzynska;S. Pilarski

  • Author_Institution
    Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • fYear
    1995
  • Firstpage
    123
  • Lastpage
    131
  • Abstract
    We show that a path delay under a non-robust test may be longer than under any robust test. Thus, for a given path, a non-robust test can detect a delay fault undetectable by robust tests. This can happen even in a circuit in which all paths are robust-testable.
  • Keywords
    "Robustness","Circuit testing","Circuit faults","Electrical fault detection","Fault detection","Logic testing","Logic circuits","Propagation delay","Combinational circuits","Councils"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529825
  • Filename
    529825
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633716