DocumentCode :
3636241
Title :
2010 international symposium on VLSI design, automation and test organization
fYear :
2010
Publisher :
ieee
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Print_ISBN :
978-1-4244-5269-9
Type :
conf
DOI :
10.1109/VDAT.2010.5496765
Filename :
5496765
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3636241
