New method suitable for relative short distance measurement

A new method for relative short distance measurement of reflective surfaces was designed. The relative distance is derived from a frequency where two interfering coherent signals (one is reflected from the measured object, the second is a reference one) create a sharp signal minimum. The viability of the method was preliminary experimentally verified in X-band. Potential possibilities of the method were tested by software simulation. Sub-micron distance resolution in industrial applications can be supposed.