مرکز منطقه ای اطلاع رساني علوم و فناوري - IEEE Standard 1149.1 Test Access Port And Boundary Scan Implementation In High Density CMOS Gate Arrays

DocumentCode :

3640549

Title :

IEEE Standard 1149.1 Test Access Port And Boundary Scan Implementation In High Density CMOS Gate Arrays

Author :

M. Reddy;Dandas Tang Dandas Tang;R. Jones

fYear :

1992

fDate :

6/14/1905 12:00:00 AM

Publisher :

ieee

Conference_Titel :

Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992

Print_ISBN :

0-7803-0246-X

Type :

conf

DOI :

10.1109/CICC.1992.591297

Filename :

5727345

Link To Document :