DocumentCode :
3644040
Title :
Device for overhead contact line height and stagger measurement
Author :
Libor Hargaš;Peter Šmaller;Eubomír Záborský
Author_Institution :
University of Ž
fYear :
2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper provides information about device for overhead contact line height and stagger measurement. This device was developed in Department of mechatronics and electronics, University of Žilina in collaboration with Railways Researched and Developed Institute in Vrútky. The device is determined for overhead contact line continuous measurement. The based measured parameters are overhead contact line height and stagger. The measurement cycle is determined by passed trajectory. The other measured parameters are evolved from optional GPS module. Data are written to an internal memory. The data can be copied to MMC/SD card and they can be analyzed in PC. The special software for analyzing was created.
Keywords :
"Semiconductor device measurement","Detectors","Software","Universal Serial Bus","Global Positioning System","Keyboards","Trajectory"
Publisher :
ieee
Conference_Titel :
Applied Electronics (AE), 2011 International Conference on
ISSN :
1803-7232
Print_ISBN :
978-1-4577-0315-7
Type :
conf
Filename :
6049070
Link To Document :
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