Title :
Wirebonding on various multichip module substrates and metallurgies
Author :
H.K. Charles;K.J. Mach;R.L. Edwards;S.J. Lehtonen;D.M. Lee
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
Abstract :
Wirebonding is still the mainstay, first-level interconnect for worldwide electronic products. As high-density circuit technology such as multichip modules enter production, wirebonding is faced with new challenges. Characteristic of these challenges is the requirement to bond to a wide range of pad metallurgies placed on top of a variety of substrates or layers including semiconductors, oxides, ceramics, and organics. Our work presents a systematic study of thermosonic gold ball bonding on aluminum, gold, and composite (e.g., chromium/copper/gold) metallization layers on several rigid and soft substrate systems. Bondability is evaluated using the ball shear and other test methods.
Keywords :
"Multichip modules","Substrates","Bonding","Gold","Integrated circuit interconnections","Production","Ceramics","Aluminum","Chromium","Copper"
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Print_ISBN :
0-7803-3857-X
DOI :
10.1109/ECTC.1997.606243